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1

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Upper-bound computation for optimal retargeting in IEEE1687 networks

Zadegan, Farrokh Ghani, Krenz-Baath, Rene, Larsson, Erik

Year:

2016

Language:

english

File:

PDF, 1.75 MB

english, 2016

2

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints

Zadegan, Farrokh Ghani, Ingelsson, Urban, Asani, Golnaz, Carlsson, Gunnar, Larsson, Erik

Year:

2011

Language:

english

File:

PDF, 234 KB

english, 2011

3

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687

Petersen, Kim, Nikolov, Dimitar, Ingelsson, Urban, Carlsson, Gunnar, Zadegan, Farrokh Ghani, Larsson, Erik

Year:

2014

Language:

english

File:

PDF, 208 KB

english, 2014

4

Access Time Analysis for IEEE P1687

Zadegan, Farrokh Ghani, Ingelsson, Urban, Carlsson, Gunnar, Larsson, Erik

Journal:

IEEE Transactions on Computers

Year:

2012

Language:

english

File:

PDF, 3.75 MB

english, 2012

5

[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Accessing Embedded DfT Instruments with IEEE P1687

Larsson, Erik, Zadegan, Farrokh Ghani

Year:

2012

Language:

english

File:

PDF, 364 KB

english, 2012

6

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Test Time Analysis for IEEE P1687

Zadegan, Farrokh Ghani, Ingelsson, Urban, Carlsson, Gunnar, Larsson, Erik

Year:

2010

Language:

english

File:

PDF, 986 KB

english, 2010

7

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - Design, Verification, and Application of IEEE 1687

Zadegan, Farrokh Ghani, Larsson, Erik, Jutman, Artur, Devadze, Sergei, Krenz-Baath, Rene

Year:

2014

Language:

english

File:

PDF, 347 KB

english, 2014

8

[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - Access time minimization in IEEE 1687 networks

Krenz-Baath, Rene, Zadegan, Farrokh Ghani, Larsson, Erik

Year:

2015

Language:

english

File:

PDF, 261 KB

english, 2015

9

[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Robustness of TAP-based scan networks

Zadegan, Farrokh Ghani, Carlsson, Gunnar, Larsson, Erik

Year:

2014

Language:

english

File:

PDF, 1.01 MB

english, 2014

10

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - A suite of IEEE 1687 benchmark networks

Tsertov, Anton, Jutman, Artur, Devadze, Sergei, Reorda, Matteo Sonza, Larsson, Erik, Zadegan, Farrokh Ghani, Cantoro, Riccardo, Montazeri, Mehrdad, Krenz-Baath, Rene

Year:

2016

Language:

english

File:

PDF, 768 KB

english, 2016

11

[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - A self-reconfiguring IEEE 1687 network for fault monitoring

Zadegan, Farrokh Ghani, Nikolov, Dimitar, Larsson, Erik

Year:

2016

Language:

english

File:

PDF, 1.91 MB

english, 2016

12

[IEEE 2016 17th Latin-American Test Symposium (LATS) - Foz do Iguacu, Brazil (2016.4.6-2016.4.8)] 2016 17th Latin-American Test Symposium (LATS) - Accessing on-chip instruments through the life-time of systems

Larsson, Erik, Zadegan, Farrokh Ghani

Year:

2016

Language:

english

File:

PDF, 2.52 MB

english, 2016

13

[IEEE 2016 29th IEEE International System-on-Chip Conference (SOCC) - Seattle, WA, USA (2016.9.6-2016.9.9)] 2016 29th IEEE International System-on-Chip Conference (SOCC) - In-field system-health monitoring based on IEEE 1687

Zadegan, Farrokh Ghani, Nikolov, Dimitar, Larsson, Erik

Year:

2016

Language:

english

File:

PDF, 1.27 MB

english, 2016

14

On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks

Ghani Zadegan, Farrokh, Nikolov, Dimitar, Larsson, Erik

Journal:

IEEE Transactions on Computers

Year:

2017

Language:

english

File:

PDF, 5.20 MB

english, 2017

15

Test of Reconfigurable Modules in Scan Networks

Cantoro, Riccardo, Ghani Zadegan, Farrokh, Palena, Marco, Pasini, Paolo, Larsson, Erik, Sonza Reorda, Matteo

Journal:

IEEE Transactions on Computers

Year:

2018

Language:

english

File:

PDF, 2.05 MB

english, 2018

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